In a previous paper of this series (1) ,t it was shown that during the creep of single crystals of lead, deformation proceeded to some extent by means of slip on the octahedral plane. This was demonstrated by the formation of slip lines on the surface of the specimens. At first, a few broad bands appeared after a small amount of extension had taken place; then, as extension proceeded, more and finer lines made their appearance until the whole of the specimen surface was covered.The present paper deals with the process of deformation of the creep specimens as revealed by X-ray examination..By the use of this method, the changes taking place in the crystal structure can be observed.EXPERIMENTAL METHODThe method of preparation of the specimens, their size and the purity of the lead employed have been reported elsewhere (1). At frequent intervals, the specimens were dismantled from the test rack and X-ray back reflection photographs were taken. The specimens were so marked and set up on the X-ray machine that the same spot on the specimen surface was always examined.Copper radiation was employed, the tube voltage and current being 45 kV. and 25 m.a. respectively and the exposure time 2 hrs. The slit diameter was 1 mm.